Datasheet BA76220 (Holtek) - 7

BA76220 PIR Controller Functional Description TEST
The TEST pin is an output which is used to test the 32kHz system frequency. The TEST/SC is a shared pin. The pin is used as TEST within 1 second after power-on.
SC
The SC pin is an output pin which is used to for LVD and CDS detection. The TEST/SC is a shared pin. The pin is used as SC after 1 second of power-on.
DT
The DT pin is a delay time oscillator input pin. It is connected to an external RC to obtain the desired output turn-on duration. Variable output turn-on durations can be achieved by selecting various values of RC or using a variable resistor. The DT structure is shown below. VREG + Comp - CLK SR FFI DT + Comp - Oscillator
DT Oscillator Structure MODE
The MODE pin is a tristate input which is used to select the desired device operating mode.
MODE Status Operating Mode Description
VDD ON Output is always ON: OUTPUT pin activated VSS OFF Output is always OFF: OUTPUT pin inactive OPEN AUTO Outputs remain in the off state till activated by a valid PIR input trigger signal. The device provides the following additional function: If the pin is asserted a high pulse which is more than 400ms within 1 second after power-on, the device will be forced to enter the test mode, and when the device enters the test mode, the power-on delay time is changed from 40 seconds to 10 seconds. Rev. 1.00 7 September 08, 2025 Document Outline Features Applications General Description Block Diagram Pin Assignment Pin Description Absolute Maximum Ratings Electrical Characteristics Functional Description TEST SC DT MODE CDS OUTPUT LVD Trigger Timing Retrigger LVD & CDS Detect Circuit The Criterion of LVD and CDS The Criterion of MODE Conditions for Disabling the PIR Amplifier Circuit Selection of OSC or DT Write ROM & Data Updated Communication Write/Read Value Protocol Registers PIR Amplifier Power-on Flow Application Circuits OTP-based Application Circuit RC-based Application Circuit Package Information 16-pin NSOP (150mil) Outline Dimensions