IXGH 32N170A IXGT 32N170AFig. 7. TransconductanceFig. 8. Dependence of E on RoffG 45 8 TJ = 125ºC 40 7 VGE = 15V 35 VCE = 850V TJ = -40ºC 6 IC = 64A 30 25ºC ens 125ºC oules 25 5 iem illiJ S - 20 - m 4 I f s ff C = 32A g o 15 E 3 10 2 5 IC = 16A 0 1 0 10 20 30 40 50 60 70 80 0 5 10 15 20 25 30 I - Amperes R - Ohms C G Fig. 10. Dependence of E onFig. 9. Dependence of Eoffoff on IcTem perature 6 7 R R G = 3Ω G = 3Ω R 5 RG= 15Ω - - - - - 6 G = 15Ω - - - - - V V GE = 15V GE = 15V V 5 VCE = 850V IC = 64A 4 CE = 850V oules oules 4 illiJ T 3 J = 125ºC M illiJ - f m 3 of - f E 2 of I E C = 32A 2 TJ = 25ºC 1 1 IC = 16A 0 0 16 24 32 40 48 56 64 25 35 45 55 65 75 85 95 105 115 125 I - Amperes C T - Degrees Centigrade J Fig. 11. Gate ChargeFig. 12. Capacitance 15 10000 V f = 1 MHz CE = 850V IC = 21A 12 IG = 10mA F Cies p 1000 9 e - olts V itanc - Coes G E 6 V apac C 100 Cres 3 0 10 0 30 60 90 120 150 0 5 10 15 20 25 30 35 40 Q - nanoCoulombs V - Volts G C E IXYS reserves the right to change limits, test conditions, and dimensions. IXYS MOSFETs and IGBTs are covered by 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 one or moreof the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405B2 6,759,692 4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463