Datasheet ZR431 (Diodes) - 3

ZR431 ADJUSTABLE PRECISION ZENER SHUNT REGULATOR DC Test Circuits
I I V L L Input Z Input V V Z Input Z

IZOFF
N
I I Z Z I R1 I
O
REF REF
ATI
VREF R2
RM
VREF
O F N
Fig. 1 Test Circuit for V Fig.3 Test Circuit for Off State Current Z = VREF Fig. 2 Test Circuit for VZ > VREF
CE I
Deviation of reference input voltage, VDEV, is defined as the maximum variation of the reference input voltage over the full
ADVAN
temperature range. The average temperature coefficient of the reference input voltage, VREF is defined as: VMAX V ×1000000 V ppm ( /o C) dev = ref V ( 1 T − T2) ref The dynamic output impedance, RZ is defined as: V Δ z R = z V = V - V I Δ DEV MAX MIN z VMIN When the device is programmed with two external resistors, R1 and R2, (Fig 2), the dynamic output impedance of the overall circuit, R’, is defined as: 1 R R′ = R 1 ( + ) z R2 T1 Temperature T2

ZR431 3 of 9 October 2011 Document number: DS33255 Rev. 6 - 2
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