Datasheet TLP2312 (Toshiba) - 5

TLP2312 11. Switching Characteristics (Note) (Unless otherwise specified, Ta = -40 to 125 , VDD = 2.2 to 5.5 V) Test Characteristics Symbol Note Test Condition Min Typ. Max Unit Circuit Propagation delay time (L/H) tpLH (Note 1) Fig. VIN = 2.5 V  26.8 250 ns Propagation delay time (H/L) t 12.1.5 RIN = 470 Ω pHL  27.3 250 CIN = 68 pF Pulse width distortion |tpHL-tpLH|  0.5 20 Propagation delay skew tpsk (Note 1), -40  40 (device to device) (Note 2) Propagation delay time (L/H) tpLH (Note 1) VIN = 3.3 V  32.7 250 Propagation delay time (H/L) t RIN = 1 kΩ pHL  28.2 250 CIN = 22 pF Pulse width distortion |tpHL-tpLH|  4.5 20 Propagation delay skew tpsk (Note 1), -45  45 (device to device) (Note 2) Propagation delay time (L/H) tpLH (Note 1) VIN = 5 V  31.3 250 Propagation delay time (H/L) t RIN = 2.2 kΩ pHL  28.5 250 CIN = 10 pF Pulse width distortion |tpHL-tpLH|  2.8 20 Propagation delay skew tpsk (Note 1), -45  45 (device to device) (Note 2) Rise time tr (Note 1) VIN = 0 → 3.3 V, RIN = 1 kΩ,  2.2  CIN = 22 pF Fall time tf VIN = 3.3 → 0 V, RIN = 1 kΩ,  1.6  CIN = 22 pF High-level common-mode CMH Fig. IF = 2 mA, ±20 ±40  kV/µs transient immunity 12.1.6 VCM = 1000 Vp-p, Ta = 25 Low-level common-mode CML IF = 0 mA, ±20 ±40  kV/µs transient immunity VCM = 1000 Vp-p, Ta = 25 Note: All typical values are at VDD = 3.3 V, Ta = 25 , unless otherwise noted. Note 1: f = 2.5 MHz, duty = 50 %, input current tr = tf = 5 ns or less. Note 2: The propagation delay skew, tpsk, is equal to the magnitude of the worst-case difference in tpHL and/or tpLH that will be seen between units at the same given conditions (supply voltage, input current, temperature, etc). ©2020 5 2020-03-31 Toshiba Electronic Devices & Storage Corporation Rev.2.0