Datasheet LTM4653 (Analog Devices) - 5

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ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the specified internal operating temperature range (Note 2). TA = 25°C, Test Circuit, VIN = SVIN = 48V, EXTVCC = 24V, RUN = 3.3V, RISET = 480k, RfSET = 57.6kΩ, fSW = 1.5MHz (CLKIN driven with 1.2MHz clock signal) unless otherwise noted. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS Temperature Sensor
∆V + – TEMP Temperature Sensor Forward Voltage, ITEMP = 100µA and ITEMP = –100μA at TA = 25°C 0.6 V V + – TEMP – VTEMP TC∆V(TEMP) ∆VTEMP Temperature Coefficient –2.0 mV/°C
Note 1:
Stresses beyond those listing under Absolute Maximum Ratings
Note 5:
To ensure minimum on time criteria is met, VOUT(0.5VDC) high-line may cause permanent damage to the device. Exposure to any Absolute regulation is tested at 13.2VIN, with fSET and CLKIN open circuit. See the Maximum Rating conditions for extended periods may affect device Applications Information section. reliability and lifetime.
Note 6.
See Applications Information Section for Dropout Criteria.
Note 2:
The LTM4653 is tested under pulsed load conditions such that
Note 7.
This IC includes overtemperature protection that is intended TJ ≈ TA. The LTM4653E is guaranteed to meet performance specifications to protect the device during momentary overload conditions. Junction over the 0°C to 125°C internal operating temperature range. Specifications temperature will exceed 125°C when overtemperature protection is active. over the full –40°C to 125°C internal operating temperature range are Continuous operation above the specified maximum operating junction assured by design, characterization and correlation with statistical process temperature may impair device reliability. controls. The LTM4653I is guaranteed to meet specifications over the full
Note 8
. The INTV internal operating temperature range. Note that the maximum ambient CC Abs Max peak output current is specified as the sum of current drawn by circuits internal to the module biased off of INTV temperature consistent with these specifications is determined by specific CC and current drawn by external circuits biased off of INTV operating conditions in conjunction with board layout, the rated package CC. See the Applications Information section. thermal resistance and other environmental factors.
Note 3:
See output current derating curves for different VIN, VOUT, and TA, located in the Applications Information section.
Note 4:
Minimum on-time, VIN Overvoltage Lockout and Overvoltage Lockout Hysteresis, and EXTVCC Switchover Threshold are tested at wafer sort. Rev. A For more information www.analog.com 5 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Electrical Characteristics Typical Performance Characteristics Pin Functions Test Circuit Decoupling Requirements Operation Operation Operation Applications Information Typical Applications Package Photograph Package Description Typical Application Related Parts