Datasheet ADIS16360, ADIS16365 (Analog Devices)

HerstellerAnalog Devices
BeschreibungSix Degrees of Freedom Inertial Sensor
Seiten / Seite20 / 1 — Six Degrees of Freedom Inertial Sensor. Data Sheet. ADIS16360/. …
RevisionE
Dateiformat / GrößePDF / 389 Kb
DokumentenspracheEnglisch

Six Degrees of Freedom Inertial Sensor. Data Sheet. ADIS16360/. ADIS16365. FEATURES. APPLICATIONS

Datasheet ADIS16360, ADIS16365 Analog Devices, Revision: E

Textversion des Dokuments

Six Degrees of Freedom Inertial Sensor Data Sheet ADIS16360/ ADIS16365 FEATURES APPLICATIONS Triaxis digital gyroscope with digital range scaling Medical instrumentation ±75°/sec, ±150°/sec, ±300°/sec settings Robotics Tight orthogonal alignment: <0.05° Platform controls Triaxis digital accelerometer: ±18 g Navigation Autonomous operation and data collection GENERAL DESCRIPTION No external configuration commands required
The ADIS16360/ADIS16365 iSensor® devices are complete inertial
Start-up time: 180 ms
systems that include a triaxis gyroscope and triaxis accelerometer.
Sleep mode recovery time: 4 ms
Each sensor in the ADIS16360/ADIS16365 combines industry-
Factory-calibrated sensitivity, bias, and axial alignment
leading iMEMS® technology with signal conditioning that optimizes
Calibration temperature range
dynamic performance. The factory calibration characterizes each
ADIS16360: +25°C
sensor for sensitivity, bias, alignment, and linear acceleration (gyro
ADIS16365: −40°C to +85°C
bias). As a result, each sensor has its own dynamic compensation
SPI-compatible serial interface
formulas that provide accurate sensor measurements.
Wide bandwidth: 330 Hz Embedded temperature sensor
The ADIS16360/ADIS16365 provide a simple, cost-effective
Programmable operation and control
method for integrating accurate, multiaxis inertial sensing into
Automatic and manual bias correction controls
industrial systems, especial y when compared with the complexity
Bartlett window, FIR filter length, number of taps
and investment associated with discrete designs. All necessary
Digital I/O: data ready, alarm indicator, general-purpose
motion testing and calibration are part of the production process
Alarms for condition monitoring
at the factory, greatly reducing system integration time. Tight
Sleep mode for power management
orthogonal alignment simplifies inertial frame alignment in naviga-
DAC output voltage
tion systems. An improved SPI interface and register structure
Enable external sample clock input: up to 1.2 kHz
provide faster data collection and configuration control.
Single-command self-test
The ADIS16360/ADIS16365 use a compatible pinout and the same
Single-supply operation: 4.75 V to 5.25 V
package as the ADIS1635x family. Therefore, systems that currently
2000 g shock survivability
use the ADIS1635x family can upgrade their performance with
Operating temperature range: −40°C to +105°C
minor firmware adjustments in their processor designs. These compact modules are approximately 23 mm × 23 mm × 23 mm and provide a flexible connector interface that enables multiple mounting orientation options.
FUNCTIONAL BLOCK DIAGRAM AUX_ADC AUX_DAC TEMPERATURE SENSOR TRI-AXIS MEMS CS ANGULAR RATE SENSOR SIGNAL CALIBRATION OUTPUT SCLK CONDITIONING AND REGISTERS AND DIGITAL AND SPI DIN CONVERSION INTERFACE PROCESSING DOUT TRI-AXIS MEMS ACCELERATION SENSOR ALARMS POWER VCC MANAGEMENT DIGITAL SELF-TEST CONTROL GND ADIS16360/ ADIS16365
001
RST DIO1 DIO2 DIO3 DIO4/CLKIN
07570- Figure 1.
Rev. E Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Fax: 781.461.3113 ©2009–2012 Analog Devices, Inc. All rights reserved.
Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Basic Operation Reading Sensor Data Device Configuration Memory Map Burst Read Data Collection Output Data Registers Calibration Manual Bias Calibration Gyroscope Automatic Bias Null Calibration Gyroscope Precision Automatic Bias Null Calibration Restoring Factory Calibration Linear Acceleration Bias Compensation (Gyroscope) Operational Control Global Commands Internal Sample Rate Power Management Sensor Bandwidth Digital Filtering Dynamic Range Input/Output Functions General-Purpose I/O Input Clock Configuration Data Ready I/O Indicator Auxiliary DAC Diagnostics Self-Test Memory Test Status Alarm Registers Product Identification Applications Information Installation/Handling Gyroscope Bias Optimization Input ADC Channel Interface Printed Circuit Board (PCB) Outline Dimensions Ordering Guide