Datasheet ADIS16334 (Analog Devices) - 5

HerstellerAnalog Devices
BeschreibungLow Profile, Six Degrees of Freedom Inertial Sensor
Seiten / Seite21 / 5 — ADIS16334. Data Sheet. Parameter. Test Conditions/Comments. Min. Typ. …
RevisionD
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DokumentenspracheEnglisch

ADIS16334. Data Sheet. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit

ADIS16334 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit

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ADIS16334 Data Sheet Parameter Test Conditions/Comments Min Typ Max Unit
FLASH MEMORY Endurance2 10,000 Cycles Data Retention3 TJ = 85°C 20 Years FUNCTIONAL TIMES4 Time until data is available Power-On Start-Up Time Normal mode 180 ms Reset Recovery Time Normal mode 60 ms Flash Memory Test Time Normal mode 20 ms Self-Test Time SMPL_PRD = 0x0001 14 ms CONVERSION RATE Internal Sample Rate SMPL_PRD = 0x0001 819.2 SPS Tolerance ±3 % Sync Input Clock5 SMPL_PRD = 0x0000 0.8 1.2 kHz POWER SUPPLY Supply Voltage 4.75 5.0 5.25 V Power Supply Current 47 mA 1 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 2 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 3 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction temperature. 4 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy. 5 The sync input clock functions below the specified minimum value, at reduced performance levels. Rev. B | Page 4 of 20 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Gyroscopes Accelerometers Data Sampling and Processing Calibration User Interface SPI Interface Basic Operation Reading Sensor Data Burst Read Function Memory Map Output Data Registers Gyroscopes Accelerometers Internal Temperature Measurements Device Configuration Dual Memory Structure Digital Processing Configuration Sample Rate Input Clock Configuration Digital Filtering Dynamic Range Optimizing Accuracy Automatic Bias Correction Manual Bias Correction Restoring Factory Calibration Point-of-Percussion/Linear-g Compensation System Tools Global Commands General-Purpose I/O Data Ready I/O Indicator Self-Test Memory Test Status Device Identification Flash Memory Management Alarms Static Alarm Use Dynamic Alarm Use Alarm Reporting Alarm Example Applications Information ADIS16334/PCBZ Installation Mounting Approaches Outline Dimensions Ordering Guide