REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED 88-08-26 D. A. DiCENZO Add case outlines, terminal connections and thermal resistance values for case
outlines 2 and 3. For device type 01, 02, and 03, add subgroup 3 to IIH and IIL
test, add RDS1 test, add VISO test, delete VCT test, change RL and CL test A conditions for tON(A) and tOFF(A) tests, change CL test condition for tON(EN)
and tOFF(EN) tests, change value of ID for RDS1 test, change value of ID and
VS for RDS2 test, add test condition circuits. Editorial changes throughout. B Add device types 07, 08, and 09. Table I changes. Editorial changes
throughout. 93-06-28 M. A. FRYE C Changes in accordance with NOR 5962-R061-95. 95-01-25 M. A. FRYE D Changes in accordance with NOR 5962-R032-96. 96-01-09 M. A. FRYE E Incorporate NOR’s and current requirements.
Editorial changes throughout. -drw 02-12-30 R. MONNIN F Make change to the tON(A) and tOFF(A) subgroup 9 test limit for devices 01, 02,
and 03 as specified under Table I. -ro 07-09-13 R. HEBER REV F F F SHEET 35 36 37 REV F F F F F F F F F F F F F F F F F F F F SHEET 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 REV STATUS REV F F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY
MARCIA B. KELLEHER STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil CHECKED BY
RAY MONNIN APPROVED BY
D. A. DiCENZO MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER /
DEMULTIPLEXER, MONOLITHIC SILICON DRAWING APPROVAL DATE …