Datasheet Texas Instruments SN74BCT8240ADW — Datenblatt

HerstellerTexas Instruments
SerieSN74BCT8240A
ArtikelnummerSN74BCT8240ADW
Datasheet Texas Instruments SN74BCT8240ADW

Boundary-Scan-Testgerät IEEE Std 1149.1 (JTAG) mit oktalinvertierenden Puffern 24-SOIC 0 bis 70

Datenblätter

Scan Test Devices With Octal Inverting Buffers datasheet
PDF, 424 Kb, Revision: E, Datei veröffentlicht: Dec 1, 1996
Auszug aus dem Dokument

Preise

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

Pin24
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Package QTY25
CarrierTUBE
Device MarkingBCT8240A
Width (mm)7.5
Length (mm)15.4
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical DataHerunterladen

Parameter

Bits8
F @ Nom Voltage(Max)70 Mhz
ICC @ Nom Voltage(Max)52 mA
Operating Temperature Range0 to 70 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Package GroupSOIC
Package Size: mm2:W x L24SOIC: 160 mm2: 10.3 x 15.5(SOIC) PKG
RatingCatalog
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
Voltage(Nom)5 V
tpd @ Nom Voltage(Max)9 ns

Öko-Plan

RoHSCompliant

Anwendungshinweise

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, Datei veröffentlicht: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to

Modellreihe

Serie: SN74BCT8240A (1)
  • SN74BCT8240ADW

Herstellerklassifikation

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic