Datasheet Texas Instruments SNJ54BCT8374AFK — Datenblatt
| Hersteller | Texas Instruments |
| Serie | SN54BCT8374A |
| Artikelnummer | SNJ54BCT8374AFK |
Scan-Testgeräte mit kantengetriggerten Oktal-D-Flip-Flops 28-LCCC -55 bis 125
Datenblätter
Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet
PDF, 435 Kb, Revision: E, Datei veröffentlicht: Jul 1, 1996
Auszug aus dem Dokument
Status
| Lifecycle Status | Active (Recommended for new designs) |
| Manufacture's Sample Availability | No |
Verpackung
| Pin | 28 | 28 | 28 | 28 |
| Package Type | FK | FK | FK | FK |
| Industry STD Term | LCCC | LCCC | LCCC | LCCC |
| JEDEC Code | S-CQCC-N | S-CQCC-N | S-CQCC-N | S-CQCC-N |
| Package QTY | 1 | 1 | 1 | 1 |
| Carrier | TUBE | TUBE | TUBE | TUBE |
| Device Marking | 5962- | 8374AFK | 9172701Q3A | SNJ54BCT |
| Width (mm) | 11.43 | 11.43 | 11.43 | 11.43 |
| Length (mm) | 11.43 | 11.43 | 11.43 | 11.43 |
| Thickness (mm) | 1.83 | 1.83 | 1.83 | 1.83 |
| Pitch (mm) | 1.27 | 1.27 | 1.27 | 1.27 |
| Max Height (mm) | 2.03 | 2.03 | 2.03 | 2.03 |
| Mechanical Data | Herunterladen | Herunterladen | Herunterladen | Herunterladen |
Öko-Plan
| RoHS | See ti.com |
Modellreihe
Serie: SN54BCT8374A (4)
- 5962-9172701Q3A 5962-9172701QLA SNJ54BCT8374AFK SNJ54BCT8374AJT
Herstellerklassifikation
- Semiconductors > Space & High Reliability > Logic Products > Flip-Flop/Latch/Registers