Datasheet Texas Instruments SNJ54BCT8244AJT — Datenblatt

HerstellerTexas Instruments
SerieSN54BCT8244A
ArtikelnummerSNJ54BCT8244AJT
Datasheet Texas Instruments SNJ54BCT8244AJT

Scan-Testgeräte mit Oktalpuffern 24-CDIP -55 bis 125

Datenblätter

Scan Test Devices With Octal Buffers datasheet
PDF, 385 Kb, Revision: E, Datei veröffentlicht: Jul 1, 1996
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Preise

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

Pin24242424
Package TypeJTJTJTJT
Industry STD TermCDIPCDIPCDIPCDIP
JEDEC CodeR-GDIP-TR-GDIP-TR-GDIP-TR-GDIP-T
Package QTY1111
CarrierTUBETUBETUBETUBE
Device MarkingTASNJ54BCT8244AJ5962-9172601ML
Width (mm)6.926.926.926.92
Length (mm)32323232
Thickness (mm)4.74.74.74.7
Pitch (mm)2.542.542.542.54
Max Height (mm)5.085.085.085.08
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Parameter

Bits8
ICC @ Nom Voltage(Max)52 mA
Input TypeTTL
Operating Temperature Range-55 to 125 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Output TypeTTL
Package GroupCDIP
Package Size: mm2:W x LSee datasheet (CDIP) PKG
RatingMilitary
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
tpd @ Nom Voltage(Max)8.5 ns

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Modellreihe

Herstellerklassifikation

  • Semiconductors > Space & High Reliability > Logic Products > Specialty Logic Products > Boundary Scan (JTAG)