Datasheet Texas Instruments ADS5545 — Datenblatt

HerstellerTexas Instruments
SerieADS5545
Datasheet Texas Instruments ADS5545

14-Bit-Analog-Digital-Wandler (ADC) mit 170 MSPS

Datenblätter

14 Bit 170 MSPS ADC With DDR LVDS/CMOS Outputs (Rev. C)
PDF, 2.3 Mb, Revision: C, Datei veröffentlicht: May 7, 2007
14 Bit 170 MSPS ADC With DDR LVDS/CMOS Outputs datasheet
PDF, 2.3 Mb, Revision: C, Datei veröffentlicht: May 7, 2007
Auszug aus dem Dokument

Preise

Status

ADS5545IRGZTADS5545IRGZTG4
Lifecycle StatusActive (Recommended for new designs)Active (Recommended for new designs)
Manufacture's Sample AvailabilityNoNo

Verpackung

ADS5545IRGZTADS5545IRGZTG4
N12
Pin4848
Package TypeRGZRGZ
Industry STD TermVQFNVQFN
JEDEC CodeS-PQFP-NS-PQFP-N
Package QTY250250
CarrierSMALL T&RSMALL T&R
Device MarkingAZ5545AZ5545
Width (mm)77
Length (mm)77
Thickness (mm).9.9
Pitch (mm).5.5
Max Height (mm)11
Mechanical DataHerunterladenHerunterladen

Parameter

Parameters / ModelsADS5545IRGZT
ADS5545IRGZT
ADS5545IRGZTG4
ADS5545IRGZTG4
# Input Channels11
Analog Input BW, MHz500
Analog Input BW(MHz)500
Approx. Price (US$)110.62 | 100u
ArchitecturePipelinePipeline
DNL(Max), +/-LSB0.5
DNL(Max)(+/-LSB)0.5
DNL(Typ), +/-LSB0.5
ENOB, Bits12
ENOB(Bits)12
INL(Max), +/-LSB3
INL(Max)(+/-LSB)3
INL(Typ), +/-LSB3
Input BufferNo
Input Range22V (p-p)
InterfaceParallel CMOS,Parallel LVDSParallel LVDS
Serial SPI Interface
Operating Temperature Range, C-40 to 85
Operating Temperature Range(C)-40 to 85
Package GroupVQFNVQFN
Package Size(mm2=WxL)48VQFN: 49 mm2: 7 x 7
Package Size: mm2:W x L, PKG48VQFN: 49 mm2: 7 x 7(VQFN)
Power Consumption(Typ), mW1100
Power Consumption(Typ)(mW)1100
RatingCatalogCatalog
Reference ModeExt,IntInt
Ext
Resolution, Bits14
Resolution(Bits)14
SFDR, dB85
SFDR(dB)85
SINAD, dB73
SINAD(dB)73
SNR, dB74
SNR(dB)74
Sample Rate (max)(SPS)170MSPS
Sample Rate(Max), MSPS170

Öko-Plan

ADS5545IRGZTADS5545IRGZTG4
RoHSCompliantCompliant
Pb FreeYes

Anwendungshinweise

  • QFN Layout Guidelines
    PDF, 1.3 Mb, Datei veröffentlicht: Jul 28, 2006
    Board layout and stencil information for most Texas Instruments Quad Flat No-Lead (QFN) devices is provided in their data sheets. This document helps printed-circuit board designers understand and better use this information for optimal designs.
  • CDCE62005 as Clock Solution for High-Speed ADCs
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    TI has introduced a family of devices well-suited to meet the demands for high-speed ADC devices such as the ADS5527 which is capable of sampling up to 210 MSPS. To realize the full potential of these high-performance products it is imperative to provide a low phase noise clock source. The CDCE62005 clock synthesizer chip offers a real-world clocking solution to meet these stringent requirements
  • Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)
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  • Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)
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  • Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
    PDF, 376 Kb, Datei veröffentlicht: Apr 28, 2009
    This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
  • Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
    PDF, 327 Kb, Revision: A, Datei veröffentlicht: Sep 10, 2010
    This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
  • Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
    PDF, 2.3 Mb, Datei veröffentlicht: Jun 2, 2008
    This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
  • CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
    PDF, 424 Kb, Datei veröffentlicht: Jun 8, 2008
    Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
  • Principles of Data Acquisition and Conversion (Rev. A)
    PDF, 132 Kb, Revision: A, Datei veröffentlicht: Apr 16, 2015
  • A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
    PDF, 425 Kb, Revision: B, Datei veröffentlicht: Oct 9, 2011
    This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
  • Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
    PDF, 69 Kb, Revision: A, Datei veröffentlicht: May 18, 2015

Modellreihe

Serie: ADS5545 (2)

Herstellerklassifikation

  • Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)