Datasheet Texas Instruments CD4511BEE4 — Datenblatt

Data sheet acquired from Harris Semiconductor
SCHS072B – Revised July 2003 Lamp Test (LT), Blanking (BL), and Latch
Enable or Strobe inputs are provided to test
the display, shut off or intensity-modulate it,
and store or strobe a BCD code, respectively.
Several different signals may be multiplexed
and displayed when external multiplexing
circuitry is used.
The CD4511B types are supplied in 16-lead
hermetic dual-in-line ceramic packages
(F3A suffix), 16-lead dual-in-line plastic
packages (E suffix), 16-lead small-outline
packages (NSR suffix), and 16-lead thin
shrink small-outline packages (PW and PWR
suffixes).
These devices are similar to the type
MC14511. Copyright пЈ© 2003, Texas Instruments Incorporated PACKAGE OPTION ADDENDUM www.ti.com 10-Jun-2014 PACKAGING INFORMATION
Orderable Device Status
(1) Package Type Package Pins Package
Drawing
Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (В°C) Device Marking
(4/5) CD4511BE ACTIVE PDIP N 16 25 Pb-Free
(RoHS) CU NIPDAU N / A for Pkg Type -55 to 125 CD4511BE CD4511BEE4 ACTIVE PDIP N 16 25 Pb-Free …