Datasheet Texas Instruments V62/04726-01XE — Datenblatt

 SGLS170 -JUNE 2003    
 


  

FEATURES
D Controlled Baseline D
D
D
D
D
D
D
D
D
D † Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature cycle,
autoclave or unbiased HAST, electromigration, bond intermetallic
life, and mold compound life. Such qualification testing should not
be viewed as justifying use of this component beyond specified
performance and environmental limits. SUPPLY CURRENT
vs
SUPPLY VOLTAGE …