Datasheet Texas Instruments OPA552FA/500G3 — Datenblatt

HerstellerTexas Instruments
SerieOPA552
ArtikelnummerOPA552FA/500G3
Datasheet Texas Instruments OPA552FA/500G3

Hochspannungs- und Hochstrom-Operationsverstärker 7-DDPAK / TO-263 -40 bis 125

Datenblätter

OPA55x High-Voltage, High-Current Operational Amplifiers datasheet
PDF, 1.2 Mb, Revision: B, Datei veröffentlicht: Jan 7, 2016
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Preise

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

Verpackung

Pin7
Package TypeKTW
Industry STD TermTO-263
JEDEC CodeR-PSFM-G
Package QTY500
CarrierLARGE T&R
Device MarkingOPA552FA
Width (mm)8.89
Length (mm)10.1
Thickness (mm)4.44
Pitch (mm)1.27
Max Height (mm)4.65
Mechanical DataHerunterladen

Parameter

Additional FeaturesDecompensated
ArchitectureFET
CMRR(Min)92 dB
CMRR(Typ)102 dB
GBW(Typ)12 MHz
Input Bias Current(Max)100 pA
Iq per channel(Max)8.5 mA
Iq per channel(Typ)7 mA
Number of Channels1
Offset Drift(Typ)7 uV/C
Operating Temperature Range-40 to 125 C
Output Current(Typ)380 mA
Package GroupDDPAK/TO-263
Package Size: mm2:W x L7DDPAK/TO-263: 154 mm2: 15.24 x 10.1(DDPAK/TO-263) PKG
Rail-to-RailNo
RatingCatalog
Slew Rate(Typ)24 V/us
Total Supply Voltage(Max)60 +5V=5, +/-5V=10
Total Supply Voltage(Min)8 +5V=5, +/-5V=10
Vos (Offset Voltage @ 25C)(Max)3 mV

Öko-Plan

RoHSCompliant

Design Kits und Evaluierungsmodule

  • Evaluation Modules & Boards: OPAMPEVM
    Universal Operational Amplifier Evaluation Module
    Lifecycle Status: Active (Recommended for new designs)

Anwendungshinweise

  • Optoelectronics Circuit Collection
    PDF, 261 Kb, Datei veröffentlicht: Jun 11, 2001
    This application report presents a collection of analog circuits that may be useful in electro-optic applications such as optical networking. The circuits are Avalanche Photodiode Bias Supply 1; Linear TEC Driver-1, -2, and -3; Laser Diode Driver-1 and -2; and Temperature Under- and Over-range Sensing with a Window Comparator.
  • MTTF, Failrate, Reliability, and Life Testing
    PDF, 51 Kb, Datei veröffentlicht: Oct 4, 2000
    At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr

Modellreihe

Herstellerklassifikation

  • Semiconductors > Amplifiers > Operational Amplifiers (Op Amps) > Power Op Amps