REVISIONS
LTR DATE (YR-MO-DA) APPROVED A Change to one part-one number format. Add table III. Editorial changes
throughout. DESCRIPTION 91-12-11 M. A. FRYE B Make changes to Slew rate test as specified under Table I.
Changes in accordance with NOR 5962-R049-95. 94-12-21 M. A. FRYE 96-11-26 R. MONNIN Add case outline K. Table I, slew rate test, in the conditions column delete
“VIN = ±5.0 V” and “measured at VOUT = ±2.5 V”. Table IIA, group C end-point
parameters; for device class V add “1,2,3,4,5,6,7,8 2/”.
Changes in accordance with NOR 5962-R035-97. C D Removed table III, burn-in, dynamic burn-in, static and dynamic test circuits.
Drawing updated to reflect current requirements. -rrp 02-12-17 R. MONNIN E Update boilerplate paragraphs to current MIL-PRF-38535 requirements. -rrp 10-03-02 C. SAFFLE F Deleted appendix A. Added paragraph 6.7 PIN supersession information.
Update drawing to current MIL-PRF-38535 requirements. -rrp 16-12-19 C. SAFFLE G Add radiation hardened requirements for device type 01. -ro 17-03-24 C. SAFFLE REV
SHEET
REV
SHEET
REV STATUS REV G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY
MARCIA B. KELLEHER STANDARD
MICROCIRCUIT
DRAWING DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil CHECKED BY
D. A. DiCENZO
APPROVED BY THIS DRAWING IS AVAILABLE
FOR USE BY ALL
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